Ion beam figuring (IBF) provides a quality corrective polishing process under vacuum, using accelerated argon atoms to ablate minuscule errors and achieve extremely high precision to a few nanometers, with a local resolution in the sub-millimeter range.
A user-friendly software provides analysis and visualization of measured data from different sources to prepare a simulation for the machining process. The fully automated machine doesn't require any human monitoring and you can customize the graphical user interface to reflect your application.
The IBF measuring system uses low-coherence technology to determine the etch-rate profile of your ion source with highest precision. It includes an interchangeable sample holder for a wide variety of materials. Multiple measurements can be made with a single measuring head.
You can change the aperture for the ion beam source during operation (inside the vacuum chamber), with up to five diaphragms, measuring range from 0.5 mm to 20 mm in diameter.
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